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Semiconductor device fabrication
Results: 2185

#	Item
331	Photon Factory Activity Report 2010 #28 Part BSurface and Interface 2C/2008S2-003 Thermal stability of TiN/HfSiON gate stack structures studied by synchrotron-radiation photoemission spectroscopy Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2012-01-30 04:32:45 Condensed matter physics Atomic physics Spectroscopy Photoemission spectroscopy Semiconductor device fabrication Work function Core electron Chemical state Titanium nitride Physics Chemistry Emission spectroscopy
332	Advances in Pulsed Electron Deposition Reel-to-Reel demonstrations (Courtesy of Dr. Hans Christen, Oak Ridge National Laboratory) Under a DOE program, a Neocera Pulsed Electron Deposition (PED) source has been integrated Add to Reading List Source URL: www.neocera.com Language: English - Date: 2013-01-04 14:36:03 Semiconductor device fabrication High-temperature superconductors Coating Printing Pulsed laser deposition Yttrium barium copper oxide Oak Ridge National Laboratory Chemistry Thin film deposition Materials science
333	830 Goldschmidt Conference Abstracts Development of a micro-interdigitated electrode array Add to Reading List Source URL: goldschmidt.info Language: English - Date: 2011-09-22 15:04:45 Mass spectrometry Electrochemistry Physical chemistry Doping Electrode Redox Chemistry Science Semiconductor device fabrication
334	The CNST News S U M M E RW W W . N I S T . G O V / C N S T Add to Reading List Source URL: nist.gov Language: English - Date: 2011-07-26 09:48:52 Electron microscopy Semiconductor device fabrication Thin film deposition Emerging technologies National Institute of Standards and Technology Extreme ultraviolet lithography Graphene Transmission electron microscopy Nanowire Physics Science Materials science
335	Contact Us Keck SMIL Keck SMIL Contact Information: Phone: Add to Reading List Source URL: www.research.psu.edu Language: English - Date: 2010-03-25 15:36:35 Electrical phenomena Physical quantities Metamaterials Nanomaterials Ceramic materials Piezoelectricity Capacitor Lead zirconate titanate Semiconductor device fabrication Physics Electromagnetism Condensed matter physics
336	Photon Factory Activity Report 2008 #26 Part BSurface and Interface 2C/2008S2-003 In-depth profiles of Hf-based gate insulator films on Si substrates studied by angle-resolved photoemission spectroscopy Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:36:04 High-k dielectric Transistors Physics Photoemission spectroscopy Chemistry Angle-resolved photoemission spectroscopy Annealing Layer Materials science Emission spectroscopy Semiconductor device fabrication Electronic engineering
337	PHYSICAL REVIEW B 69, 035210 共2004兲 Evolution of voids in Al¿ -implanted ZnO probed by a slow positron beam Z. Q. Chen, M. Maekawa, S. Yamamoto, and A. Kawasuso Advanced Science Research Center, Japan Atomic Energy Add to Reading List Source URL: www.geocities.jp Language: English - Date: 2004-02-02 06:41:33 Spectroscopy Semiconductor device fabrication Materials science Spintronics Ion implantation Zinc oxide Positron annihilation spectroscopy Ohmic contact Annealing Physics Chemistry Quantum electrodynamics
338	letters to nature .............................................................. Ultrafast and direct imprint of nanostructures in silicon Stephen Y. Chou, Chris Keimel & Jian Gu Add to Reading List Source URL: www.princeton.edu Language: English* - Date: 2006-08-19 16:37:09 Technology Nanoimprint lithography Polycrystalline silicon Silicon Wafer Gas immersion laser doping Laser Excimer laser Ion laser Chemistry Semiconductor device fabrication Materials science
339	Goldschmidt 2000 September 3rd–8th, 2000 Oxford, UK. Journal of Conference Abstracts Volume 5(2), 1050 Add to Reading List Source URL: www.the-conference.com Language: English - Date: 2009-11-05 06:03:44 Semiconductor device fabrication Space dust Radiobiology Meteorites Planetary science Ion implantation Presolar grains Irradiation Diamond Chemistry Physics Astronomy
340	Journal of Crystal Growth–117 Numerical investigation of the inﬂuence of EM-ﬁelds on ﬂuid motion and resistivity distribution during ﬂoating-zone growth of large silicon single crystals a Add to Reading List Source URL: www.mhd-crystal.lv Language: English - Date: 2003-02-27 08:19:21 Semiconductor device fabrication Materials science Condensed matter physics Electrical resistivity and conductivity Dopant Doping Silicon Crystal Chemistry Physics Matter

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